Metrologia latest papers http://stacks.iop.org/0026-1394 Metrologia is the leading international journal in pure and applied metrology, specialising in the more fundamental aspects of measurement, especially in improving standards for the SI base units. Metrologia is published in partnership with the Bureau International des Poids et Mesures (BIPM). en-gb Copyright © IOP Publishing 2011 Thu, 01 Jan 1970 00:00:00 GMT Thu, 01 Jan 1970 00:00:00 GMT http://syndication.iop.org/about/ custserv@iop.org (Customer Services) Metrologia http://images.iop.org/website-logos/ejs_logo.png http://stacks.iop.org/ Methods for the assessment of correction for chemical-impurity effects and related uncertainty in ITS-90 fixed points, namely of e-H2, Ne, O2 and Ar http://stacks.iop.org/0026-1394/48/i=5/a=005?rss=2.0 Author(s): Franco Pavese<br>Affiliation(s): Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy Thu, 07 Jul 2011 23:00:00 GMT Investigation of differently designed Pd–C eutectic fixed-point cells for the calibration of thermocouples http://stacks.iop.org/0026-1394/48/i=5/a=006?rss=2.0 Author(s): F Edler and W Zheng<br>Affiliation(s): Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, 10587 Berlin, Germany; National Institute of Metrology, (NIM), No 18, Beisanhuan Donglu, Beijing 100013, People's Republic of China Thu, 07 Jul 2011 23:00:00 GMT Synchrotron radiation-based bilateral intercomparison of ultraviolet source calibrations http://stacks.iop.org/0026-1394/48/i=5/a=004?rss=2.0 Author(s): U Arp, R Klein, Z Li, W Paustian, M Richter, P-S Shaw and R Thornagel<br>Affiliation(s): Electron and Optical Physics Division, National Institute of Standards and Technology, 100 Bureau Dr, MS 8410, Gaithersburg, MD 20899-8410, USA; Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12, D-10587 Berlin, Germany Thu, 07 Jul 2011 23:00:00 GMT Final report on the Seventh International Comparison of Absolute Gravimeters (ICAG 2005) http://stacks.iop.org/0026-1394/48/i=5/a=003?rss=2.0 Author(s): Z Jiang, O Francis, L Vitushkin, V Palinkas, A Germak, M Becker, G D'Agostino, M Amalvict, R Bayer, M Bilker-Koivula, S Desogus, J Faller, R Falk, J Hinderer, C Gagnon, T Jakob, E Kalish, J Kostelecky, Chiungwu Lee, J Liard, Y Lokshyn, B Luck, J Makinen, S Mizushima, N Le Moigne, C Origlia, E R Pujol, P Richard, L Robertsson, D Ruess, D Schmerge, Y Stus, S Svitlov, S Thies, C Ullrich, M Van Camp, A Vitushkin, W Ji and H Wilmes<br>Affiliation(s): Bureau International des Poids et Mesures (BIPM), Sevres, France; Faculty of Science, Technology and Communication, University of Luxembourg, Luxembourg; Geodetic Observatory Pecny (GOP), Research Institute of Geodesy, Topography and Cartography, Ondrejov, Czech Republic; National Institute of Metrological Research (INRiM), Torino, Italy; Institute of Physical Geodesy, Darmstadt University of Technology (IPGD), Darmstadt, Germany; Ecole et Observatoire des Sciences de la Terre (EOST), Strasbourg, France; Dynamics of the Lithosphere Laboratory CNRS/Montpellier University, Montpellier, France; Finnish Geodetic Institute (FGI), Masala, Finland; JILA, University of Colorado-National Institute of Standards and Technology (NIST), Boulder, CO, USA; Federal Agency of Cartography and Geodesy (BKG), Frankfurt/Main, Germany; Natural Resources Canada (NRCan), Ottawa, Canada; Institute for Automation and Electronics, Russian Academy of Sciences, Novosibirsk, Russian Federation; Center for Measurement Standards, Industrial Technology Research Institute (CMS/ITRI), Chinese Taipei, Taiwan; National Scientific Centre 'Institute of Metrology', Kharkov, Ukraine; National Metrology Institute of Japan, National Institute for Advanced Industrial Sciences and Technology (NMIJ/AIST), Tsukuba, Japan; Instituto Geografico Nacional (IGN), Madrid, Spain; Federal Office of Metrology (METAS), Bern-Wabern, Switzerland; Federal Office of Metrology and Surveying (BEV), Vienna, Austria; United States Geological Survey, Longmont, CO, USA; Royal Observatory of Belgium (ROB), Brussels, Belgium; AOSense, Inc., Sunnyvale, CA, USA; National Institute of Metrology (NIM), Beijing, People's Republic of China Wed, 22 Jun 2011 23:00:00 GMT Investigations at INRIM on a Pd–C cell manufactured by NPL http://stacks.iop.org/0026-1394/48/i=5/a=002?rss=2.0 Author(s): M Battuello, M Florio and G Machin<br>Affiliation(s): Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy; National Physical Laboratory (NPL), Teddington, Middlesex TW11 0LW, UK Wed, 15 Jun 2011 23:00:00 GMT Bayesian uncertainty analysis for a regression model versus application of GUM Supplement 1 to the least-squares estimate http://stacks.iop.org/0026-1394/48/i=5/a=001?rss=2.0 Author(s): Clemens Elster and Blaza Toman<br>Affiliation(s): Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12, 10587 Berlin, Germany; Statistical Engineering Division, Information Technology Laboratory, National Institute of Standards and Technology, US Department of Commerce, Gaithersburg, MD, USA Wed, 15 Jun 2011 23:00:00 GMT