Metrologia latest papers http://stacks.iop.org/0026-1394 Metrologia is the leading international journal in pure and applied metrology, specialising in the more fundamental aspects of measurement, especially in improving standards for the SI base units. Metrologia is published in partnership with the Bureau International des Poids et Mesures (BIPM). en-gb Copyright © IOP Publishing 2009 Thu, 01 Jan 1970 00:00:00 GMT Thu, 01 Jan 1970 00:00:00 GMT http://syndication.iop.org/about/ custserv@iop.org (Customer Services) Metrologia http://images.iop.org/website-logos/ejs_logo.png http://stacks.iop.org/ Experimental determination of the 233U half-life http://stacks.iop.org/0026-1394/46/i=5/a=007?rss=2.0 Author(s): S Pomme, T Altzitzoglou, R Van Ammel, G Sibbens, R Eykens, S Richter, J Camps, K Kossert, H Janssen, E Garcia-Torano, T Duran and F Jaubert<br>Affiliation(s): European Commission, Joint Research Centre, Institute for Reference Materials and Measurements, Retieseweg 111, B-2440 Geel, Belgium; Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, D-38116 Braunschweig, Germany; Laboratorio de Metrologia de Radiaciones Ionizantes, CIEMAT, Avda. Complutense 22, 28040 Madrid, Spain; LNE-LNHB, Laboratoire National Henri Becquerel, CEA-Saclay, F 91191 Gif-sur-Yvette Cedex, France Thu, 25 Jun 2009 23:00:00 GMT Oxides in metal fixed points of the ITS-90 http://stacks.iop.org/0026-1394/46/i=5/a=006?rss=2.0 Author(s): Martin Fahr and Steffen Rudtsch<br>Affiliation(s): Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany; National Research Council of Canada (NRC), 1200, Montreal Road, Building M-36, Ottawa ON K1A 0R6, Canada Thu, 25 Jun 2009 23:00:00 GMT Absolute frequency shifts of iodine cells for laser stabilization http://stacks.iop.org/0026-1394/46/i=5/a=008?rss=2.0 Author(s): Josef Lazar, Jan Hrabina, Petr Jedlicka and Ondrej Cip<br>Affiliation(s): Institute of Scientific Instruments, Academy of Sciences of the Czech Republic, Kralovopolska 147, 612 64 Brno, Czech Republic Thu, 25 Jun 2009 23:00:00 GMT The coefficient of thermal expansion of highly enriched 28Si http://stacks.iop.org/0026-1394/46/i=5/a=005?rss=2.0 Author(s): Guido Bartl, Arnold Nicolaus, Ernest Kessler, Rene Schodel and Peter Becker<br>Affiliation(s): Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, D-38116 Braunschweig, Germany; National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899 USA Tue, 23 Jun 2009 23:00:00 GMT A Johnson noise thermometer with traceability to electrical standards http://stacks.iop.org/0026-1394/46/i=5/a=004?rss=2.0 Author(s): Luca Callegaro, Vincenzo D'Elia, Marco Pisani and Alessio Pollarolo<br>Affiliation(s): INRIM--Istituto Nazionale di Ricerca Metrologica, Strada delle Cacce, 91, 10135 Torino, Italy Tue, 23 Jun 2009 23:00:00 GMT Reduction of the uncertainty of the PTB vacuum pressure scale by a new large area non-rotating piston gauge http://stacks.iop.org/0026-1394/46/i=5/a=001?rss=2.0 Author(s): Th Bock, H Ahrendt and K Jousten<br>Affiliation(s): Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, D-10587 Berlin, Germany Wed, 10 Jun 2009 23:00:00 GMT Uncertainty evaluation for linking a bilateral key comparison with the corresponding CIPM key comparison http://stacks.iop.org/0026-1394/46/i=5/a=002?rss=2.0 Author(s): M Ojanen, M Shpak, P Karha, R Leecharoen and E Ikonen<br>Affiliation(s): Helsinki University of Technology (TKK), Metrology Research Institute, PO Box 3000, FI-02015 TKK, Finland; National Institute of Metrology, Thailand (NIMT), Kluang Luang Patumthanee 12120, Thailand; Centre for Metrology and Accreditation (MIKES), PO Box 9, FI-02151 Espoo, Finland Wed, 10 Jun 2009 23:00:00 GMT On the convergence of the Monte Carlo block design http://stacks.iop.org/0026-1394/46/i=5/a=003?rss=2.0 Author(s): Martin Muller and Christian Rink<br>Affiliation(s): Department of Computer Science, ETH Zurich, CH-8092, Switzerland; Institute of Robotics and Mechatronics, German Aerospace Center (DLR), D-82234 Wessling, Germany Wed, 10 Jun 2009 23:00:00 GMT Spectral irradiance comparison using a multi-wavelength filter radiometer http://stacks.iop.org/0026-1394/46/i=4/a=S09?rss=2.0 Author(s): Y J Liu, G Xu, M Ojanen and E Ikonen<br>Affiliation(s): National Metrology Centre, Agency for Science and Technology Research (A*STAR), Singapore; Metrology Research Institute, Helsinki University of Technology (TKK), Finland; Centre for Metrology and Accreditation (MIKES), Finland Mon, 01 Jun 2009 23:00:00 GMT Towards traceable radiometry in the terahertz region http://stacks.iop.org/0026-1394/46/i=4/a=S05?rss=2.0 Author(s): L Werner, H-W Hubers, P Meindl, R Muller, H Richter and A Steiger<br>Affiliation(s): Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, 10587 Berlin, Germany; German Aerospace Center (DLR), Rutherfordstrasse 2, 12489 Berlin, Germany Mon, 01 Jun 2009 23:00:00 GMT Supercontinuum sources for metrology http://stacks.iop.org/0026-1394/46/i=4/a=S27?rss=2.0 Author(s): John T Woodward, Allan W Smith, Colleen A Jenkins, Chungsan Lin, Steven W Brown and Keith R Lykke<br>Affiliation(s): Optical Technology Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD 20899, USA; Space Dynamics Laboratory, Joint NIST/USU Program in Optical Sensor Calibration, USA; Jung Research and Development Corp., Washington, DC 20009, USA Mon, 01 Jun 2009 23:00:00 GMT The Metrology Light Source operated as a primary source standard http://stacks.iop.org/0026-1394/46/i=4/a=S25?rss=2.0 Author(s): R Klein, G Brandt, R Fliegauf, A Hoehl, R Muller, R Thornagel and G Ulm<br>Affiliation(s): Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12, D-10587 Berlin, Germany Mon, 01 Jun 2009 23:00:00 GMT Photon-number discriminating superconducting transition-edge sensors http://stacks.iop.org/0026-1394/46/i=4/a=S28?rss=2.0 Author(s): Mauro Rajteri, Emanuele Taralli, Chiara Portesi, Eugenio Monticone and Jorn Beyer<br>Affiliation(s): Istituto Nazionale di Ricerca Metrologica (INRIM), Strada delle Cacce 91, 10135 Torino, Italy; Physikalisch-Technische Bundesanstalt, Berlin, Germany Mon, 01 Jun 2009 23:00:00 GMT Photon number resolving detection with high speed and high quantum efficiency http://stacks.iop.org/0026-1394/46/i=4/a=S29?rss=2.0 Author(s): D Fukuda, G Fujii, T Numata, A Yoshizawa, H Tsuchida, H Fujino, H Ishii, T Itatani, S Inoue and T Zama<br>Affiliation(s): National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan; Institute of Quantum Science, Nihon University, 1-8-14 Kanda-Surugadai, Chiyoda-ku, Tokyo 101-8303, Japan Mon, 01 Jun 2009 23:00:00 GMT Absolute flux calibration of stars: calibration of the reference telescope http://stacks.iop.org/0026-1394/46/i=4/a=S16?rss=2.0 Author(s): Allan W Smith, John T Woodward, Colleen A Jenkins, Steven W Brown and Keith R Lykke<br>Affiliation(s): NIST, 100 Bureau Drive, Gaithersburg, MD 20899, USA; Space Dynamics Laboratory, Joint NIST/USU Program in Optical Sensor Calibration, USA Mon, 01 Jun 2009 23:00:00 GMT Convenient integrating sphere scanner for accurate luminous flux measurements http://stacks.iop.org/0026-1394/46/i=4/a=S22?rss=2.0 Author(s): S Winter, M Lindemann, W Jordan, U Binder and M Anokhin<br>Affiliation(s): Physikalisch-Technische Bundesanstalt, Braunschweig, Germany; OSRAM GmbH, Munich, Germany; Czibula and Grundmann GmbH, Berlin, Germany Mon, 01 Jun 2009 23:00:00 GMT Calculable blackbody radiation as a source for the determination of the spectral responsivity of THz detectors http://stacks.iop.org/0026-1394/46/i=4/a=S06?rss=2.0 Author(s): B Gutschwager, C Monte, H Delsim-Hashemi, O Grimm and J Hollandt<br>Affiliation(s): Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12, 10587 Berlin, Germany; Universitat Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany; ETH Zurich, Schaffmattstrasse 20, 8093 Zurich, Switzerland Mon, 01 Jun 2009 23:00:00 GMT The impact of cooling on CCD-based camera systems in the field of image luminance measuring devices http://stacks.iop.org/0026-1394/46/i=4/a=S23?rss=2.0 Author(s): Udo Kruger and Franz Schmidt<br>Affiliation(s): TechnoTeam Bildverarbeitung GmbH, Ilmenau, Germany Mon, 01 Jun 2009 23:00:00 GMT Extension of the NIST spectral responsivity scale to the infrared using improved-NEP pyroelectric detectors http://stacks.iop.org/0026-1394/46/i=4/a=S04?rss=2.0 Author(s): G P Eppeldauer, J Zeng, H W Yoon, B Wilthan, T C Larason and L M Hanssen<br>Affiliation(s): National Institute of Standards and Technology, Gaithersburg, MD 20899-8441, USA Mon, 01 Jun 2009 23:00:00 GMT A new absolute diffuse reflectance measurement in the near-IR region based on the modified double-sphere method http://stacks.iop.org/0026-1394/46/i=4/a=S10?rss=2.0 Author(s): Hiroshi Shitomi and Ichiro Saito<br>Affiliation(s): National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (NMIJ AIST), AIST-3, Umezono 1-1-1, Tsukuba, Ibaraki 305-8563, Japan Mon, 01 Jun 2009 23:00:00 GMT Assessment of a pixel-to-pixel metrological approach to the measurement of astronomical magnitudes http://stacks.iop.org/0026-1394/46/i=4/a=S18?rss=2.0 Author(s): A Ferrero, L Hanlon, J French, G Melady, B McBreen, J Campos and A Pons<br>Affiliation(s): Space Science Group, School of Physics, University College Dublin, Dublin 4, Ireland; Departamento de Metrologia, Instituto de Fisica Aplicada, Consejo Superior de Investigaciones Cientificas (CSIC), Madrid, Spain Mon, 01 Jun 2009 23:00:00 GMT Absolute cryogenic radiometer and solid-state trap detectors for IR power scales down to 1 pW with 0.1% uncertainty http://stacks.iop.org/0026-1394/46/i=4/a=S02?rss=2.0 Author(s): Adriaan C Carter, Solomon I Woods, Stephen M Carr, Timothy M Jung and Raju U Datla<br>Affiliation(s): National Institute of Standards and Technology, NIST, Gaithersburg, MD, USA; Jung Research and Development Corp., Washington, DC, USA Mon, 01 Jun 2009 23:00:00 GMT Reflectance calculations for a predictable quantum efficient detector http://stacks.iop.org/0026-1394/46/i=4/a=S03?rss=2.0 Author(s): Meelis Sildoja, Farshid Manoocheri and Erkki Ikonen<br>Affiliation(s): Metrology Research Institute, Helsinki University of Technology (TKK) and Centre for Metrology and Accreditation (MIKES), Espoo, Finland Mon, 01 Jun 2009 23:00:00 GMT The spectral photon flux of the radiometric calibration spectral source for the NIRSpec instrument of the James Webb Space Telescope http://stacks.iop.org/0026-1394/46/i=4/a=S14?rss=2.0 Author(s): R D Taubert, C Monte, C Baltruschat, A Schirmacher, B Gutschwager, J Hartmann, J Hollandt, D Kochems, C Kuchel and M te Plate<br>Affiliation(s): Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany; EADS Astrium GmbH, Munich, Germany; European Space Agency (ESA), Noordwijk, The Netherlands Mon, 01 Jun 2009 23:00:00 GMT The 10th International Conference on New Developments and Applications in Optical Radiometry (NEWRAD 2008) http://stacks.iop.org/0026-1394/46/i=4/a=E01?rss=2.0 Author(s): Erkki Ikonen<br>Affiliation(s): Chairman, NEWRAD Scientific Committee Mon, 01 Jun 2009 23:00:00 GMT Dispersion-relation-based method for determining gloss http://stacks.iop.org/0026-1394/46/i=4/a=S20?rss=2.0 Author(s): Jisoo Hwang, Dong-Joo Shin and Ki-Lyong Jeong<br>Affiliation(s): Heat and Light Metrology Center, Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, Korea Mon, 01 Jun 2009 23:00:00 GMT Camera-based investigation of high-temperature fixed points for radiometric application http://stacks.iop.org/0026-1394/46/i=4/a=S24?rss=2.0 Author(s): K Anhalt, D Lindner, U Kruger, F Schmidt and J Hartmann<br>Affiliation(s): Physikalisch-Technische Bundesanstalt, Braunschweig und Berlin, Germany; Technoteam GmbH, Ilmenau, Germany Mon, 01 Jun 2009 23:00:00 GMT Group III-nitride semiconductor Schottky barrier photodiodes for radiometric use in the UV and VUV regions http://stacks.iop.org/0026-1394/46/i=4/a=S26?rss=2.0 Author(s): Terubumi Saito, Toshimi Hitora, Hideaki Ishihara, Mikihiko Matsuoka, Hisako Hitora, Hiroji Kawai, Ichiro Saito and Eiichi Yamaguchi<br>Affiliation(s): National Metrology Institute of Japan, AIST, Umezono 1-1-1, Tsukuba, Ibaraki 305-8568, Japan; ALGAN K.K., ASTEM Bldg. 202, Chudojiminami-cho 134, Shimogyo-ku, Kyoto 600-8813, Japan; Graduate School of Policy and Management, Doshisha University, Karasuma-Imadegawa, Kamigyo-ku, Kyoto 602-8580, Japan; Iwasaki Electric Co, Ltd., Gyoda, Saitama 361-0021, Japan; Powdec K.K., Hagizono 2500, Chigasaki, Kanagawa 253-0071, Japan Mon, 01 Jun 2009 23:00:00 GMT Calibration of low-background temperature IR test chambers used to calibrate space sensors http://stacks.iop.org/0026-1394/46/i=4/a=S15?rss=2.0 Author(s): Adriaan C Carter, Raju U Datla and Timothy M Jung<br>Affiliation(s): US National Institute of Standards and Technology, 100 Bureau Drive, MS 8441, Gaithersburg, MD 20899, USA; Jung Research and Development Corp. 1706 U Street NW, Washington, DC 20009, USA Mon, 01 Jun 2009 23:00:00 GMT Absolute stellar photometry on moderate-resolution FPA images http://stacks.iop.org/0026-1394/46/i=4/a=S17?rss=2.0 Author(s): Thomas C Stone<br>Affiliation(s): US Geological Survey, 2255 N Gemini Dr., Flagstaff, AZ 86001, USA Mon, 01 Jun 2009 23:00:00 GMT Comparison of different measurement methods for transmittance haze http://stacks.iop.org/0026-1394/46/i=4/a=S19?rss=2.0 Author(s): Hsueh-Ling Yu and Chin-Chai Hsaio<br>Affiliation(s): Industrial Technology Research Inst., Bldg 16, 321 Kuang Fu Rd, Sec 2, Hsichu, Taiwan, Republic of China Mon, 01 Jun 2009 23:00:00 GMT Measurement of the ultraviolet-induced fluorescence yield from integrating spheres http://stacks.iop.org/0026-1394/46/i=4/a=S11?rss=2.0 Author(s): Ping-Shine Shaw, Uwe Arp and Keith R Lykke<br>Affiliation(s): Physics Laboratory, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA Mon, 01 Jun 2009 23:00:00 GMT Performance limitations of carbon-cavity blackbodies due to absorption bands at the highest temperatures http://stacks.iop.org/0026-1394/46/i=4/a=S07?rss=2.0 Author(s): Peter Sperfeld, Sven Pape, Boris Khlevnoy and Andrey Burdakin<br>Affiliation(s): Physikalisch-Technische Bundesanstalt (PTB), Braunschweig & Berlin, Germany; All-Russian Research Institute for Optical and Physical Measurements (VNIIOFI), Moscow, Russia Mon, 01 Jun 2009 23:00:00 GMT The PREMOS/PICARD instrument calibration http://stacks.iop.org/0026-1394/46/i=4/a=S13?rss=2.0 Author(s): Werner Schmutz, Andre Fehlmann, Gregor Hulsen, Peter Meindl, Rainer Winkler, Gerard Thuillier, Peter Blattner, Francois Buisson, Tatiana Egorova, Wolfgang Finsterle, Nigel Fox, Julian Grobner, Jean-Franccois Hochedez, Silvio Koller, Mustapha Meftah, Mireille Meisonnier, Stephan Nyeki, Daniel Pfiffner, Hansjorg Roth, Eugene Rozanov, Marcel Spescha, Christoph Wehrli, Lutz Werner and Jules U Wyss<br>Affiliation(s): Physikalisch-Meteorologisches Observatorium Davos/World Radiation Center (PMOD/WRC), Davos, Switzerland; Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany; National Physical Laboratory (NPL), Teddington, UK; Service d'Aronomie du CNRS, Verrieres-le Buisson, France; Federal Office of Metrology, Bern, Switzerland; CNES, Toulouse, France; Royal Observatory of Belgium, Brussels, Belgium Mon, 01 Jun 2009 23:00:00 GMT CCPR-S1 Supplementary comparison for spectral radiance in the range of 220 nm to 2500 nm http://stacks.iop.org/0026-1394/46/i=4/a=S08?rss=2.0 Author(s): Boris Khlevnoy, Victor Sapritsky, Bernard Rougie, Charles Gibson, Howard Yoon, Arnold Gaertner, Dieter Taubert and Juergen Hartmann<br>Affiliation(s): All-Russian Research Institute for Optical and Physical Measurements (VNIIOFI), Moscow, Russia; Bureau National de Metrologie/Institut National de Metrologie (BNM/INM, now LNE-INM/Cnam), Paris, France; National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA; National Research Council of Canada (NRC), Ottawa, Canada; Physikalisch-Technische Bundesanstalt (PTB), Braunschweig and Berlin, Germany Mon, 01 Jun 2009 23:00:00 GMT Non-Lambertian behaviour of fluorescence emission from solid amorphous material http://stacks.iop.org/0026-1394/46/i=4/a=S12?rss=2.0 Author(s): Silja Holopainen, Farshid Manoocheri and Erkki Ikonen<br>Affiliation(s): Metrology Research Institute, Helsinki University of Technology (TKK), PO Box 3000, FI-02015 TKK, Finland; Centre for Metrology and Accreditation (MIKES), PO Box 9, FI-02151 Espoo, Finland Mon, 01 Jun 2009 23:00:00 GMT Radiometer standard for absolute responsivity calibrations from 950 nm to 1650 nm with 0.05% (k = 2) uncertainty http://stacks.iop.org/0026-1394/46/i=4/a=S01?rss=2.0 Author(s): G P Eppeldauer, H W Yoon, Y Zong, T C Larason, A Smith and M Racz<br>Affiliation(s): National Institute of Standards and Technology, Gaithersburg, MD, USA Mon, 01 Jun 2009 23:00:00 GMT Compact large-area uniform colour-selectable calibration light source http://stacks.iop.org/0026-1394/46/i=4/a=S21?rss=2.0 Author(s): D Voigt, I A Hagendoorn and E W M van der Ham<br>Affiliation(s): NMi Van Swinden Laboratorium B.V., Thijsseweg 11, NL-2629JA Delft, The Netherlands Mon, 01 Jun 2009 23:00:00 GMT