Measurement Science and Technology latest papers http://stacks.iop.org/0957-0233 Covering all aspects of the theory, practice and application of measurement and sensor technology, Measurement Science and Technology is a world leader in this interdisciplinary field. The journal has particularly strong coverage in the fields of measurement of fluid flow, and optical measurement techniques. en-gb Copyright © IOP Publishing 2009 Thu, 01 Jan 1970 00:00:00 GMT Thu, 01 Jan 1970 00:00:00 GMT http://syndication.iop.org/about/ custserv@iop.org (Customer Services) Measurement Science and Technology http://images.iop.org/website-logos/ejs_logo.png http://stacks.iop.org/ Hot target inspection using a welded fibre acoustic wave piezoelectric sensor and a laser-ultrasonic mirror scanner http://stacks.iop.org/0957-0233/20/i=12/a=127003?rss=2.0 Author(s): Chen Ciang Chia, Jung-Ryul Lee and He-Jin Shin<br>Affiliation(s): Department of Aerospace Engineering, Chonbuk National University, 664-14 Duckjin-dong, Duckjin-gu, Jeonju, Chonbuk, 561-756, South Korea Fri, 06 Nov 2009 00:00:00 GMT Fault diagnosis of rotating machinery using an improved HHT based on EEMD and sensitive IMFs http://stacks.iop.org/0957-0233/20/i=12/a=125701?rss=2.0 Author(s): Yaguo Lei and Ming J Zuo<br>Affiliation(s): Department of Mechanical Engineering, University of Alberta, Edmonton, Alberta, T6G 2G8, Canada Fri, 06 Nov 2009 00:00:00 GMT Estimation of the size distribution of magnetic nanoparticles using modified magnetization curves http://stacks.iop.org/0957-0233/20/i=12/a=125802?rss=2.0 Author(s): Wenzhong Liu, Ming Zhou and Li Kong<br>Affiliation(s): Department of Control Science and Engineering, Huazhong University of Science and Technology, Wuhan, Hubei Province 430074, People's Republic of China Fri, 06 Nov 2009 00:00:00 GMT Three-dimensional reconstruction of endoscope images by a fast shape from shading method http://stacks.iop.org/0957-0233/20/i=12/a=125801?rss=2.0 Author(s): Guo-hui Wang, Jiu-qiang Han and Xin-man Zhang<br>Affiliation(s): School of Electronics and Information Engineering, Box 1835, Xi'an Jiaotong University, Xian-Ning West Road, Xi'an 710049, People's Republic of China Fri, 06 Nov 2009 00:00:00 GMT Development and characterization of a new instrument for the traceable measurement of areal surface texture http://stacks.iop.org/0957-0233/20/i=12/a=125102?rss=2.0 Author(s): Richard K Leach, Claudiu L Giusca and Kazuya Naoi<br>Affiliation(s): Engineering Measurement Division, National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK; School of Computing & Engineering, University of Huddersfield, Huddersfield, HD1 3DH, UK; Japan Lengths and Dimensions Division, National Metrology Institute of Japan, Umezono 1-1-1, Tsukuba, Ibaraki, 305-8563, Japan Fri, 06 Nov 2009 00:00:00 GMT Fixed kernel regression for voltammogram feature extraction http://stacks.iop.org/0957-0233/20/i=12/a=125202?rss=2.0 Author(s): F J Acevedo Rodriguez, R J Lopez-Sastre, P Gil-Jimenez, N Ruiz-Reyes and S Maldonado Bascon<br>Affiliation(s): Departamento de Teoria de la Senal y Comunicaciones. Escuela Politecnica Superior, Universidad de Alcala, 28871 Alcala de Henares, Madrid, Spain; Departamento de Ingenieria de Telecomunicacion. Escuela Politecnica Superior, Universidad de Jaen, 23700 Linares, Jaen, Spain Fri, 06 Nov 2009 00:00:00 GMT Measuring source-pull free nonlinear distortions: a multisine approach http://stacks.iop.org/0957-0233/20/i=12/a=125104?rss=2.0 Author(s): Wendy Van Moer, Rik Pintelon and Yves Rolain<br>Affiliation(s): Vrije Universiteit Brussel, Department ELEC, Pleinlaan 2, B-1050 Brussels, Belgium Fri, 06 Nov 2009 00:00:00 GMT Improved methods and uncertainty analysis in the calibration of the spring constant of an atomic force microscope cantilever using static experimental methods http://stacks.iop.org/0957-0233/20/i=12/a=125501?rss=2.0 Author(s): Charles A Clifford and Martin P Seah<br>Affiliation(s): Analytical Science Division, National Physical Laboratory, Hampton Road, Teddington, Middlesex, TW11 0LW, UK Fri, 06 Nov 2009 00:00:00 GMT An approximate formula for the capacitance–void fraction relationship for annular flows http://stacks.iop.org/0957-0233/20/i=12/a=125404?rss=2.0 Author(s): Sin Kim, Jeong Seong Lee, Kyung Youn Kim, Kyung Ho Kang and Byung Jo Yun<br>Affiliation(s): Department of Nuclear and Energy Engineering, Jeju National University, Jeju 690-756, Korea; Department of Electronic Engineering, Jeju National University, Jeju 690-756, Korea; Thermal Hydraulics Safety Research Division, Korea Atomic Energy Research Institute, Daejeon 305-353, Korea Fri, 06 Nov 2009 00:00:00 GMT Applying dual-laser spot positions measurement technology on a two-dimensional tracking measurement system http://stacks.iop.org/0957-0233/20/i=12/a=125103?rss=2.0 Author(s): Hau-Wei Lee and Chieh-Li Chen<br>Affiliation(s): Department of Aeronautics and Astronautics, National Cheng Kung University, No.1, University Road, Tainan City 701, Taiwan, Republic of China Fri, 06 Nov 2009 00:00:00 GMT Noise in MEMS http://stacks.iop.org/0957-0233/21/i=1/a=012001?rss=2.0 Author(s): F Mohd-Yasin, D J Nagel and C E Korman<br>Affiliation(s): Faculty of Engineering, Multimedia University, 63100 Cyberjaya, Selangor, Malaysia; Department of ECE, The George Washington University, Washington, DC 20052, USA Fri, 06 Nov 2009 00:00:00 GMT Single-photon generation and detection http://stacks.iop.org/0957-0233/21/i=1/a=012002?rss=2.0 Author(s): G S Buller and R J Collins<br>Affiliation(s): School of Engineering and Physical Sciences, David Brewster Building, Heriot-Watt University, Edinburgh, EH14 4AS, UK Fri, 06 Nov 2009 00:00:00 GMT