Measurement Science and Technology latest papers http://stacks.iop.org/0957-0233 Covering all aspects of the theory, practice and application of measurement and sensor technology, Measurement Science and Technology is a world leader in this interdisciplinary field. The journal has particularly strong coverage in the fields of measurement of fluid flow, and optical measurement techniques. en-gb Copyright © IOP Publishing 2009 Thu, 01 Jan 1970 00:00:00 GMT Thu, 01 Jan 1970 00:00:00 GMT http://syndication.iop.org/about/ custserv@iop.org (Customer Services) Measurement Science and Technology http://images.iop.org/website-logos/ejs_logo.png http://stacks.iop.org/ Water quality assessment by an integrated multi-sensor based on semiconductor RuO2 nanostructures http://stacks.iop.org/0957-0233/20/i=9/a=095201?rss=2.0 Author(s): Serge Zhuiykov, David O'Brien and Michael Best<br>Affiliation(s): Commonwealth Scientific Industrial Research Organisation (CSIRO), Materials Science and Engineering Division, 37 Graham Road, Highett, VIC. 3190, Australia Thu, 02 Jul 2009 23:00:00 GMT Accurate measurements of laser-induced bulk damage density http://stacks.iop.org/0957-0233/20/i=9/a=095701?rss=2.0 Author(s): L Lamaignere, T Donval, M Loiseau, J C Poncetta, G Raze, C Meslin, B Bertussi and H Bercegol<br>Affiliation(s): CEA/DAM CESTA, BP2, F33114 Le Barp, France; CEA/DAM LE RIPAULT, BP16, F37260 Monts, France Thu, 02 Jul 2009 23:00:00 GMT Interferometry based high-precision dilatometry for dimensional characterization of highly stable materials http://stacks.iop.org/0957-0233/20/i=9/a=095301?rss=2.0 Author(s): J Cordero, T Heinrich, T Schuldt, M Gohlke, S Lucarelli, D Weise, U Johann and C Braxmaier<br>Affiliation(s): Astrium GmbH - Satellites, Friedrichshafen, Germany; Escuela Superior de Ingenieros de Sevilla, Spain; University of Applied Sciences Konstanz, Germany; Humboldt-Universitat zu Berlin, Germany Thu, 02 Jul 2009 23:00:00 GMT Absolute length measurement with the frequency comb of a femtosecond laser http://stacks.iop.org/0957-0233/20/i=9/a=095302?rss=2.0 Author(s): Sangwon Hyun, Young-Jin Kim, Yunseok Kim, Jonghan Jin and Seung-Woo Kim<br>Affiliation(s): Ultrafast Optics for Ultraprecision Technology Group, Korea Advanced Institute of Science and Technology (KAIST), Science Town, Daejeon, 305-701, Korea Thu, 02 Jul 2009 23:00:00 GMT On the non-intrusive evaluation of fluid forces with the momentum equation approach http://stacks.iop.org/0957-0233/20/i=9/a=095401?rss=2.0 Author(s): L David, T Jardin and A Farcy<br>Affiliation(s): LEA, University of Poitiers, CNRS, ENSMA, SP2MI bd Marie et Pierre Curie, 86962 Futuroscope, France Thu, 02 Jul 2009 23:00:00 GMT Nanoscale mechanical characterization of polymers by atomic force microscopy (AFM) nanoindentations: viscoelastic characterization of a model material http://stacks.iop.org/0957-0233/20/i=9/a=095702?rss=2.0 Author(s): D Tranchida, Z Kiflie, S Acierno and S Piccarolo<br>Affiliation(s): Physical Chemistry Department, University of Siegen, Adolf-Reichwein-Str. 2, 57076 Siegen, Germany; Dipartimento di Ingegneria Chimica dei Processi e dei Materiali, Universita di Palermo and INSTM Udr Palermo, Viale delle Scienze, 90128 Palermo, Italy; Dipartimento di Ingegneria, Universita degli Studi del Sannio, Piazza Roma 21, 82100 Benevento, Italy Thu, 02 Jul 2009 23:00:00 GMT Detector array incorporated optical scattering instrument for nephelometric measurements on small particles http://stacks.iop.org/0957-0233/20/i=9/a=095901?rss=2.0 Author(s): Ankur Gogoi, Lakhya J Borthakur, Amarjyoti Choudhury, George A Stanciu and Gazi A Ahmed<br>Affiliation(s): Optoelectronics and Photonics Research Laboratory, Department of Physics, School of Science and Technology, Tezpur University, Tezpur-784 028, Assam, India; Department of Chemical Sciences, School of Science and Technology, Tezpur University, Tezpur-784 028, Assam, India; Centre for Microscopy-Microanalysis and Information Processing, University 'Politehnica' of Bucharest, Romania Thu, 02 Jul 2009 23:00:00 GMT 3D deformation and strain analysis in compacted sugar using x-ray microtomography and digital volume correlation http://stacks.iop.org/0957-0233/20/i=9/a=095703?rss=2.0 Author(s): F Forsberg and C R Siviour<br>Affiliation(s): Division of Experimental Mechanics, Department of Applied Physics and Mechanical Engineering, Lulea University of Technology, SE-971 87 Lulea, Sweden; Department of Engineering Science, University of Oxford, Parks Road, Oxford, OX1 3PJ, UK Thu, 02 Jul 2009 23:00:00 GMT Nanoscale metrology http://stacks.iop.org/0957-0233/20/i=8/a=080101?rss=2.0 Author(s): G B Picotto, L Koenders and G Wilkening<br>Affiliation(s): Istituto Nazionale di Ricerca Metrologica (INRIM), Strada delle Cacce 73, 10135 Torino, Italy (www.inrim.it); Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany (www.ptb.de) (Guest Editors) Mon, 29 Jun 2009 23:00:00 GMT A high precision micro/nano CMM using piezoresistive tactile probes http://stacks.iop.org/0957-0233/20/i=8/a=084001?rss=2.0 Author(s): Gaoliang Dai, Sebastian Butefisch, Frank Pohlenz and Hans-Ulrich Danzebrink<br>Affiliation(s): Physikalisch-Technische Bundesanstalt, Bundesallee 100, D-38116 Braunschweig, Germany Mon, 29 Jun 2009 23:00:00 GMT Characterization of nanoparticles by scanning electron microscopy in transmission mode http://stacks.iop.org/0957-0233/20/i=8/a=084025?rss=2.0 Author(s): E Buhr, N Senftleben, T Klein, D Bergmann, D Gnieser, C G Frase and H Bosse<br>Affiliation(s): Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany; Technische Universitat Dresden, Institut fur Verfahrens- und Umwelttechnik, 01062 Dresden, Germany Mon, 29 Jun 2009 23:00:00 GMT Comparison of measurement methods for microsystem components: application to microstructures made by the deep x-ray lithography process (x-ray LIGA) http://stacks.iop.org/0957-0233/20/i=8/a=084024?rss=2.0 Author(s): Pascal Meyer, Olaf Mader, Volker Saile and Joachim Schulz<br>Affiliation(s): Institut fur Mikrostrukturtechnik (IMT), Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany; Institut fur technische Physik (ITP), Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany Mon, 29 Jun 2009 23:00:00 GMT Development of a roughness measurement standard with irregular surface topography for improving 3D surface texture measurement http://stacks.iop.org/0957-0233/20/i=8/a=084023?rss=2.0 Author(s): Kentaro Nemoto, Kazuhisa Yanagi, Masato Aketagawa, Ichiro Yoshida, Michimasa Uchidate, Takashi Miyaguchi and Hideki Maruyama<br>Affiliation(s): Department of Mechanical Engineering, Nagaoka University of Technology, Kamitomioka 1603-1, Nagaoka, Japan; Innovation Satellite Niigata, Japan Science and Technology Agency, Japan; Department of Mechanical Engineering, Iwate University, Japan; Laser Application Research Laboratory, Industrial Research Institute of Niigata Prefecture, Japan Mon, 29 Jun 2009 23:00:00 GMT Design of a large measurement-volume metrological atomic force microscope (AFM) http://stacks.iop.org/0957-0233/20/i=8/a=084003?rss=2.0 Author(s): Brian J Eves<br>Affiliation(s): Institute for National Measurement Standards, National Research Council Canada, 1200 Montreal Rd, Ottawa, K1A 0R6, Canada Mon, 29 Jun 2009 23:00:00 GMT Advanced three-dimensional scan methods in the nanopositioning and nanomeasuring machine http://stacks.iop.org/0957-0233/20/i=8/a=084004?rss=2.0 Author(s): T Hausotte, B Percle and G Jager<br>Affiliation(s): Ilmenau University of Technology, Institute of Process Measurement and Sensor Technology, PO Box 100 565, D-98684 Ilmenau, Germany Mon, 29 Jun 2009 23:00:00 GMT Local probe microscopy with interferometric monitoring of the stage nanopositioning http://stacks.iop.org/0957-0233/20/i=8/a=084007?rss=2.0 Author(s): J Lazar, P Klapetek, O Cip, M Cizek and M Sery<br>Affiliation(s): Institute of Scientific Instruments, Academy of Sciences of the Czech Republic, Kralovopolska 147, 612 64 Brno, Czech Republic; Czech Metrology Institute, Okruzni31, 638 00 Brno, Czech Republic Mon, 29 Jun 2009 23:00:00 GMT Common path two-wavelength homodyne counting interferometer development http://stacks.iop.org/0957-0233/20/i=8/a=084009?rss=2.0 Author(s): Petr Kren and Petr Balling<br>Affiliation(s): Czech Metrology Institute, V Botanice 4, 15072 Prague 5, Czech Republic Mon, 29 Jun 2009 23:00:00 GMT A new high-aperture 193 nm microscope for the traceable dimensional characterization of micro- and nanostructures http://stacks.iop.org/0957-0233/20/i=8/a=084010?rss=2.0 Author(s): G Ehret, F Pilarski, D Bergmann, B Bodermann and E Buhr<br>Affiliation(s): Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, 38116 Braunschweig, Germany Mon, 29 Jun 2009 23:00:00 GMT Deconvolution of Kelvin probe force microscopy measurements—methodology and application http://stacks.iop.org/0957-0233/20/i=8/a=084017?rss=2.0 Author(s): T Machleidt, E Sparrer, D Kapusi and K-H Franke<br>Affiliation(s): Department of Computer Graphics Program, Ilmenau University of Technology, PO Box 100 565, D-98684 Ilmenau, Germany Mon, 29 Jun 2009 23:00:00 GMT A nanonewton force facility and a novel method for measurements of the air and vacuum permittivity at zero frequencies http://stacks.iop.org/0957-0233/20/i=8/a=084012?rss=2.0 Author(s): Vladimir Nesterov<br>Affiliation(s): Physikalisch-Technische Bundesanstalt, Braunschweig and Berlin, Bundesallee 100, D-38116 Braunschweig, Germany Mon, 29 Jun 2009 23:00:00 GMT High accuracy laser diffractometer: angle-scale traceability by the error separation method with a grating http://stacks.iop.org/0957-0233/20/i=8/a=084020?rss=2.0 Author(s): V Korpelainen, A Iho, J Seppa and A Lassila<br>Affiliation(s): Centre for metrology and accreditation (MIKES), PO Box 9, FI-02151 Espoo, Finland Mon, 29 Jun 2009 23:00:00 GMT Tip–sample relaxation as a source of uncertainty in nanoscale scanning probe microscopy measurements http://stacks.iop.org/0957-0233/20/i=8/a=084014?rss=2.0 Author(s): Anna Campbellova, Petr Klapetek and Miroslav Valtr<br>Affiliation(s): Czech Metrology Institute, Okruzni31, 638 00, Brno, Czech Republic Mon, 29 Jun 2009 23:00:00 GMT Test object of the linewidth with a trapezoidal profile and three certified sizes for an SEM and AFM http://stacks.iop.org/0957-0233/20/i=8/a=084022?rss=2.0 Author(s): V P Gavrilenko, V B Mityukhlyaev, Yu A Novikov, Yu V Ozerin, A V Rakov and P A Todua<br>Affiliation(s): Center for Surface and Vacuum Research, 40 Novatorov Str., Moscow 119421, Russia; A M Prokhorov General Physics Institute of the Russian Academy of Sciences, 38 Vavilov Str., Moscow 119991, Russia; Mikron Corporation, 12, Build 1, 1st Zapadny Proezd, Zelenograd, Moscow 124460, Russia Mon, 29 Jun 2009 23:00:00 GMT Reconstruction of feature shape and dimension through data processing of sequenced various angle atomic force microscopy (AFM) scans http://stacks.iop.org/0957-0233/20/i=8/a=084016?rss=2.0 Author(s): Andrzej Sikora<br>Affiliation(s): Division of Electrotechnology and Materials Science, Electrotechnical Institute, ul. M Sklodowskiej-Curie 55/61, 50-369 Wroclaw, Poland Mon, 29 Jun 2009 23:00:00 GMT A hybrid scanning probe microscope (SPM) module based on a DVD optical head http://stacks.iop.org/0957-0233/20/i=8/a=084005?rss=2.0 Author(s): E-T Hwu, H Illers, L Jusko and H-U Danzebrink<br>Affiliation(s): Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany; Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan Mon, 29 Jun 2009 23:00:00 GMT Coordinate metrology using scanning probe microscopes http://stacks.iop.org/0957-0233/20/i=8/a=084002?rss=2.0 Author(s): F Marinello, E Savio, P Bariani and S Carmignato<br>Affiliation(s): Department of Manufacturing Engineering and Management, University of Padova, Italy; CIVEN, Interuniversity Center for Nanotechnology, Italy; Schaefer South-East Europe s.r.l., Rovigo, Italy; DTG, University of Padova, Vicenza, Italy Mon, 29 Jun 2009 23:00:00 GMT A homodyne Michelson interferometer with sub-picometer resolution http://stacks.iop.org/0957-0233/20/i=8/a=084008?rss=2.0 Author(s): Marco Pisani<br>Affiliation(s): Istituto Nazionale di Ricerca Metrologica, INRiM, Italy Mon, 29 Jun 2009 23:00:00 GMT A multi-electrode plane capacitive sensor for displacement measurements and attitude controls http://stacks.iop.org/0957-0233/20/i=8/a=084011?rss=2.0 Author(s): Gian Bartolo Picotto, Marco Pisani and Andrea Sosso<br>Affiliation(s): Istituto Nazionale di Ricerca Metrologica (INRiM), Strada delle Cacce 91, 10135 Torino, Italy Mon, 29 Jun 2009 23:00:00 GMT A concept for automated nanoscale atomic force microscope (AFM) measurements using a priori knowledge http://stacks.iop.org/0957-0233/20/i=8/a=084026?rss=2.0 Author(s): C Recknagel and H Rothe<br>Affiliation(s): Chair of Measurement and Information Technology, Helmut-Schmidt-University/University of the Federal Armed Forces Hamburg, Holstenhofweg 83, 22043 Hamburg, Germany Mon, 29 Jun 2009 23:00:00 GMT Total reflection of x-ray fluorescence (TXRF): a mature technique for environmental chemical nanoscale metrology http://stacks.iop.org/0957-0233/20/i=8/a=084027?rss=2.0 Author(s): L Borgese, A Zacco, E Bontempi, P Colombi, R Bertuzzi, E Ferretti, S Tenini and L E Depero<br>Affiliation(s): INSTM and Chemistry for Technologies Laboratory, University of Brescia, via Branze, 38, 25123 Brescia, Italy; Istituto Zooprofilattico della Lombardia e dell'Emilia Romagna, via Bianchi 9, 25124 Brescia, Italy; Arpa Sezione di Brescia, Italy Mon, 29 Jun 2009 23:00:00 GMT Size effects on the strength of nanotube bundles http://stacks.iop.org/0957-0233/20/i=8/a=084028?rss=2.0 Author(s): Nicola Pugno, Federico Bosia and Alberto Carpinteri<br>Affiliation(s): Department of Structural Engineering and Geotechnics, Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Torino, Italy; Department of Theoretical Physics, Universita di Torino, Via Giuria 1, 10125 Torino, Italy Mon, 29 Jun 2009 23:00:00 GMT Measurement of air-refractive-index fluctuation from frequency change using a phase modulation homodyne interferometer and an external cavity laser diode http://stacks.iop.org/0957-0233/20/i=8/a=084019?rss=2.0 Author(s): Masashi Ishige, Masato Aketagawa, Tuan Banh Quoc and Yuta Hoshino<br>Affiliation(s): Department of Mechanical Engineering, Nagaoka University of Technology, Kamitomioka, Nagaoka, Niigata, 940-2188, Japan Mon, 29 Jun 2009 23:00:00 GMT Testing of x-ray microtomography systems using a traceable geometrical standard http://stacks.iop.org/0957-0233/20/i=8/a=084021?rss=2.0 Author(s): S Carmignato, D Dreossi, L Mancini, F Marinello, G Tromba and E Savio<br>Affiliation(s): Dipartimento di Tecnica e Gestione dei Sistemi Industriali, University of Padova, Italy; Sincrotrone Trieste S.C.p.A., Italy; Dipartimento di Innovazione Meccanica e Gestionale, University of Padova, Italy; CIVEN, Coordinamento Interuniversitario Veneto per le Nanotecnologie, Italy Mon, 29 Jun 2009 23:00:00 GMT Self-assembled polystyrene nanospheres for the evaluation of atomic force microscopy tip curvature radius http://stacks.iop.org/0957-0233/20/i=8/a=084015?rss=2.0 Author(s): P Colombi, I Alessandri, P Bergese, S Federici and L E Depero<br>Affiliation(s): Chemistry for Technologies Laboratory and INSTM, University of Brescia, via Branze, 38, 25123 Brescia, Italy Mon, 29 Jun 2009 23:00:00 GMT A two-dimensional atom encoder using one lateral-dithered scanning tunneling microscope (STM) tip and a regular crystalline lattice http://stacks.iop.org/0957-0233/20/i=8/a=084006?rss=2.0 Author(s): Patamaporn Chaikool, Masato Aketagawa and Eiki Okuyama<br>Affiliation(s): Department of Mechanical Engineering, Nagaoka University of Technology 1603-1 Kamitomioka, Nagaoka, Niigata, 940-2188 Japan; Department of Faculty of Resource Science and Engineering, Akita University, 1-1 Tegata-gakuen-machi, Akita, 010-8502 Japan Mon, 29 Jun 2009 23:00:00 GMT Nonlinear distortion in atomic force microscopy (AFM) measurements http://stacks.iop.org/0957-0233/20/i=8/a=084018?rss=2.0 Author(s): C Hahlweg, M Gruhlke and H Rothe<br>Affiliation(s): Helmut Schmidt University, Department of Measurement and Information Technology, Holstenhofweg 85, 22043 Hamburg, Germany Mon, 29 Jun 2009 23:00:00 GMT Geometrical modelling of scanning probe microscopes and characterization of errors http://stacks.iop.org/0957-0233/20/i=8/a=084013?rss=2.0 Author(s): F Marinello, P Bariani, S Carmignato and E Savio<br>Affiliation(s): Dipartimento di Innovazione Meccanica e Gestionale, University of Padova, Italy; CIVEN, Coordinamento Interuniversitario Veneto per le Nanotecnologie, Italy; Schaefer South-East Europe s.r.l., Rovigo, Italy; Dipartimento di Tecnica e Gestione dei Sistemi Industriali, University of Padova, Italy Mon, 29 Jun 2009 23:00:00 GMT